
The Condor series offers a single platform with multiple test capabilities allowing end-users the added flexibility of performing many types of tests, all on one system. In addition to standard bond testing applications such as wire pull, ball shear and die shear, the Condor has the capability to perform peel testing, push testing, and roller testing.
All of these tests can be done on one revolving test head that features four different measurement sensors. The system can perform mechanical shock testing by changing the test head for impact testing or ribbon peel testing of photovoltaic cells by using USB tweezers. XYZTEC also offers dedicated pull & push cartridges or shear cartridges.

The open innovative mechanical design of the Condor frame allows for many accessories to be mounted. The red dots visible on the frame offer – apart from a good looking design - possible mounting options for all kinds of accessories, like microscope, flat panel screens, etcetera. This provides a very user friendly and cost-effective approach for future expansions.
Each Condor machine offers a built-in X/Y-stage on which any object work holder can be mounted. The motorized 190mm stroke Z-stage, which resides towards the back of the platform, provides mounting for the measurement unit and accessories. The operator controls these stages by two ergonomically designed joysticks.
The Condor series consist of the Condor EZ, the Condor 100, the Condor 150 (HF) and the Condor 250 models. Within this complete range, all measurement units, hardware, PCB’s, work holders, software and accessories are interchangeable.
Click here to learn about the unique ergonomics of the Condor or click here for the specifications of the Condor platform.
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Click here to download the "Condor EZ flyer" (PDF) with details on the ergonomics and more.
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| 30..31 | May | ECTC 2012 |
| 13..15 | Jun | JPCA Show 2012 |
| 19..21 | Jun | OPTO Taiwan 2012 |
| 19..21 | Jun | PCIM Asia |
| 10..12 | Jul | Semicon West 2012 |
| 05..07 | Sep | Semicon Taiwan 2012 |
| 06..09 | Sep | CIOE China |
| 11..13 | Sep | 45. IMAPS Symposium |
| 24..28 | Sep | PV SEC 2012 |
| 01..05 | Oct | ESREF 2012 |