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5 September 2014

XYZTEC introduced an electronic newsletter today. Click here to subscribe and stay up to date about everything related to bond testing and our latest developments. The first newsletter is centered around our new 300mm wafer testing machine, the Condor Sigma W12:

Condor Sigma W12
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Sigma W12

The Condor Sigma W12 is based on XYZTEC’s market leading Condor Sigma platform. It shares many of the same features that set the Condor Sigma apart from the rest of the industry. The W12’s performance has been further enhanced for the precision and handling requirements of wafer testing.

Wafer testing up to 300mm

Condor Sigma W12 wafer chuck
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The W12 is designed to test any wafer size up to 300mm. Switching from various wafer sizes is a simple procedure. The goal was to minimize downtime for companies that have multiple wafer diameters. Many test types are possible on the Sigma W12. The most common include solder ball shear and Cold Bump Pull (CBP) testing. XYZTEC’s latest development is Pull Testing solder bumps on copper pillars. XYZTEC also offers solutions for wire bonds on wafer. With the widest range of sensors and tooling there is something to suit almost any bond test application.

Accurate fast full automation

All of XYZTEC’s axis movements are controlled with linear encoders. This technology provides unrivalled accuracy and it offers a significant improvement compared with rotary encoder solutions found on other equipment.

Condor Sigma W12 sideview
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Whether you are using the system in the manual or automatic mode, intelligent axis speed control of up to 50mm/s enables the fastest traverse time over long distances. However, the W12 employs an automatic slow down feature as the tool approaches the target. This feature ensures precision and safety. Set up time is minimal. Wafer-map import capability provides accurate and rapid data transfer of the bonds to be tested. Other production functions include; onboard barcode reading and SPC data down load.

Automatic and manual Load/Unload with warped wafer capability

The Sigma W12 offers stand-alone manual loading or it can be fully integrated with wafer loaders/un-loaders. With the optional rotary table feature, wafer orientation can be accomplished quickly and accurately using manual or automatic functionality. A range of vacuum chucks and pin transfer options enable the handling of the most challenging of wafers.

Failure mode image capture

A range of onboard camera options enable high magnification images of the failure mode. These can be saved along with the test data either automatically or under operator control.

Condor Sigma W12 Blower and Vacuum
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Debris collection

A debris collection option manages the debris resulting from test. Options include a programmable timed-pulse from an air jet to dislodge loose material from the test area, as well as a material vacuum pickup that captures loose material in a collection filter.


Newsletters

Jul 2017 Advances in Thin, 3D and MEMS Die Bond Strength Testing
May 2017 Shear testing copper pillar
Mar 2017 Fracture strength of thin wafers and die
Feb 2017 Centralized database for enhanced security and SPC options
Jan 2017 Full Automation with Improved Pattern Recognition, Fiducial Marks Analysis, Wire Detect and Failure Mode Analysis
Dec 2016 Coating and film testing
Nov 2016 Latest software release enables automatic grading
Oct 2016 Vision enhanced materials testing
Sep 2016 XYZTEC makes lid pull easy
Aug 2016 Condor Sigma W12 with large heater stage
Jul 2016 How to: Wire Pull
Jun 2016 Get 10% off your next tools order

 
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Other news

19 Jul XYZTEC granted subsidy for further accuracy improvements
23 Jun Presentation at CSPT 2017 by Bob Sykes
06 Jun Condor Sigma in São Paulo, Brazil
16 May Fully automatic lead frame tester introduced at SMT Hybrid Packaging
28 Apr Semicon Penang 2017 successful
28 Apr Pizza and Go cart racing at K1 Speed in Northern CA
14 Mar Visit us at Semicon China
16 Feb Job opening for Junior Mechanical Design Engineer [closed]
29 Nov Successful seminar in Russia with Sovtest
31 Oct Market leading Condor Sigma bond tester at TPCA Taiwan
08 Sep Automation features draw attention at Semicon Taiwan 2016
28 Jun HTMG represents XYZTEC in South America
14 Jun Bob Sykes speaks at China Semiconductor Packaging Test Symposium (CSPT) [UPDATED]
14 Jun Purchase wire hooks, shear tools, tweezer tips by PayPal
03 May SMT 2016 all about automation
11 Apr Annual sales and service event in Bangkok big success
15 Mar Come visit us at Semicon China
04 Mar HiSOL new distributor in Japan
01 Mar Cellphone display LCD driver IC testing
13 Nov ISO-Dynamique and Axend represent XYZTEC in Malaysia, Singapore, Thailand, Indonesia and Vietnam
12 Nov Wire detect functionality popular at Productronica
30 Oct How to: Cold Bump Pull
07 Sep Condor Sigma draws attention at Semicon Taiwan
03 Jul Exciting sales and service meeting in Bangkok
01 Jul Bond Test Measurement Accuracy


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